Process Technology
RFMD® GaN is production ready. It's a mature, robust technology
with extraordinary reliability. Compared to GaAs and Si, RFMD GaN has much higher
breakdown voltage and power densities, enabling applications not possible with competing
process technologies. RFMD's GaN high power density also allows for smaller devices, reducing
the capacitance enabling high impedances, wider bandwidths, and reduced cost.
Additional benefits include reduced circuit complexity, industry-leading efficiency
of operation, reduced cooling requirements, and lighter weight.
RFMD GaN Technologies
- 0.5µm gate length HEMT transistor
- AlGaN/GaN on SiC
- High power density, up to 8W/mm CW
- High breakdown voltage enables:
- 48V operating voltage CW
- 65V operating voltage pulsed
- High efficiency >65% achieved for RFMD products
- MTTF > 1x107 hours at TCHANNEL = 200°C
- 100 Ω/□ thin film resistor and epi resistor
- 135 pf/mm2 MIM capacitor with 350V breakdown
- Through wafer vias
RFMD Foundry Services offers an expanded selection of process technologies for the
external designer. High Power GaN 1 is the original process,
which was launched in Summer of 2009. RFMD has since added High Linearity
GaN 2, and also the complementary Integrated Passive Components Technology
(IPC3). IPC3 was developed to support our GaN processes and provides a lower-cost
die technology for implementing passive matching or routing circuits. It is designed
to support high current densities and high voltages on die.
|
GaN 1
|
- High power - up to 8 W/mm
- High breakdown voltage >400V
|
|
GaN 2
|
- High linearity - 6 dB improvement over GaN 1
- Reduced power density - up to 4 W/mm
- High breakdown voltage >300V
|
|
IPC3 (Integrated Passive Components for High Power)
|
- Passives only on 6" GaAs wafers
- 3 metal layers for complex interconnections and for high current capability (up
to 28 mA/µm)
- High breakdown voltage capacitors - up to 340V
|
|
Parameter
|
GaN 1
|
GaN 2
|
Units
|
|
ID-MAX
|
1000
|
550
|
mA/mm
|
|
Gate Pinch off
|
-3.5
|
-1.4
|
V
|
|
Peak gM
|
225
|
250
|
mS/mm
|
|
VBR(GD)
|
>450
|
>350
|
V
|
|
MIMCAP
|
135
|
135
|
pF/mm
|
|
RTFR
|
100
|
100
|
Ω/□
|
|
RISO
|
460
|
800
|
Ω/□
|
|
Power Density
|
7.5
|
4
|
W/mm
|
|
FT
|
11
|
9
|
GHz
|
|
FMAX
|
18
|
>20
|
GHz
|
Reliability Test Data for GaN 1 and GaN 2
Industry-leading reliability results were achieved for high temperature life testing
at 48V bias for RFMD's GaN processes.
VDS= 48V, TCHANNEL= 200ºC
|
|
GaN 1
|
GaN 2
|
Units
|
|
Total Devices Tested
|
293
|
220
|
|
|
Wafers
|
18
|
10
|
|
|
Fab Lots
|
6
|
4
|
|
|
MTTF
|
1.1E7
|
1.8E7
|
Hrs
|
|
EA
|
2.1
|
2.1
|
eV
|
GaN 1 Arrhenius Plot

GaN 2 Arrhenius Plot

For a discussion of RFMD's robust technology roadmap and opportunities, contact
our Foundry Services team: RFMDFoundryServices@rfmd.com