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Process Technology

RFMD® GaN is production ready. It's a mature, robust technology with extraordinary reliability. Compared to GaAs and Si, RFMD GaN has much higher breakdown voltage and power densities, enabling applications not possible with competing process technologies. RFMD's GaN high power density also allows for smaller devices, reducing the capacitance enabling high impedances, wider bandwidths, and reduced cost. Additional benefits include reduced circuit complexity, industry-leading efficiency of operation, reduced cooling requirements, and lighter weight.

RFMD GaN Technologies

  • 0.5µm gate length HEMT transistor
  • AlGaN/GaN on SiC
  • High power density, up to 8W/mm CW
  • High breakdown voltage enables:
    • 48V operating voltage CW
    • 65V operating voltage pulsed
  • High efficiency >65% achieved for RFMD products
  • MTTF > 1x107 hours at TCHANNEL = 200°C
  • 100 Ω/□ thin film resistor and epi resistor
  • 135 pf/mm2 MIM capacitor with 350V breakdown
  • Through wafer vias

RFMD Foundry Services offers an expanded selection of process technologies for the external designer. High Power GaN 1 is the original process, which was launched in Summer of 2009. RFMD has since added High Linearity GaN 2, and also the complementary Integrated Passive Components Technology (IPC3). IPC3 was developed to support our GaN processes and provides a lower-cost die technology for implementing passive matching or routing circuits. It is designed to support high current densities and high voltages on die.

GaN 1
  • High power - up to 8 W/mm
  • High breakdown voltage >400V
GaN 2
  • High linearity - 6 dB improvement over GaN 1
  • Reduced power density - up to 4 W/mm
  • High breakdown voltage >300V
IPC3 (Integrated Passive Components for High Power)
  • Passives only on 6" GaAs wafers
  • 3 metal layers for complex interconnections and for high current capability (up to 28 mA/µm)
  • High breakdown voltage capacitors - up to 340V
Parameter GaN 1 GaN 2 Units
ID-MAX 1000 550 mA/mm
Gate Pinch off -3.5 -1.4 V
Peak gM 225 250 mS/mm
VBR(GD) >450 >350 V
MIMCAP 135 135 pF/mm
RTFR 100 100 Ω/□
RISO 460 800 Ω/□
Power Density 7.5 4 W/mm
FT 11 9 GHz
FMAX 18 >20 GHz

Reliability Test Data for GaN 1 and GaN 2

Industry-leading reliability results were achieved for high temperature life testing at 48V bias for RFMD's GaN processes.

VDS= 48V, TCHANNEL= 200ºC

  GaN 1 GaN 2 Units
Total Devices Tested 293 220  
Wafers 18 10  
Fab Lots 6 4  
MTTF 1.1E7 1.8E7 Hrs
EA 2.1 2.1 eV

GaN 1 Arrhenius Plot GaN 1 Arrhenius Plot
GaN 2 Arrhenius Plot GaN 2 Arrhenius Plot


For a discussion of RFMD's robust technology roadmap and opportunities, contact our Foundry Services team: RFMDFoundryServices@rfmd.com

 

Foundry Services

RFMD GaN Foundry Services Brochure Thumbnail
GaN Foundry Services Brochure
Contact

RFMD® Corporate Headquarters & GaAs HBT Fabrication Facilities
7628 Thorndike Road
Greensboro, NC 27409-9421
Phone: 336.664.1233

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